The Bruker Dimension Icon atomic force microscope (AFM) takes the fullest advantage of such core imaging modes as Contact Mode and TappingMode™, and Bruker’s high-resolution AFMs feature proprietary PeakForce Tapping® to enable new research with unique nanomechanical, electrical, and chemical measurements as shown in well over 1000 peer reviewed publications. More information is available from Bruker.
The Renishaw inVia Raman microscope (AFM) includes LiveTrack™ focus tracking technology, the inVia Qontor enables users to analyze samples with uneven, curved or rough surfaces. Optimum focus is maintained in real time during data collection and white light video viewing. More information is available from Renishaw here.
This instrument utilizes the CellStream base system with 5 fluorescence channels plus forward and side scatter. The instrument has three excitation lasers at: 405 nm (175 mW), 488 nm (200 mW), and 532 nm (150 mW) with fluorescence channels 528/46 nm, 583/24 nm, 611/31 nm, 702/87 nm, 773/56 nm. Built-in 96-well plate AutoSampler with automated re-suspension of the samples. Single tube sampling system for 1.5 ml Eppendorf-tubes. Pre-installed acquisition and analysis software. Patented Amnis detection technology for high sensitivity, event gallery and additional parameters like area, aspect ratio and raw max. pixel. Upgradeable lasers include: 375 nm- 70 mW; 561 nm- 150 mW; 642 nm- 150 mW; 730 nm- 40 mW. For more information visit the website here.
Instrument: Moessbauer Spectrometer (WissEl, Germany; See Co., USA)
The Moessbauer Spectrometer Model W302 incorporates a dual-input Multi Channel Scaler (MCS), a waveform generator, a hybrid analog/digital servo amplifier, a USB interface and user-interface PC software. The hardware components are housed in a single, compact box and may be used for many applications. More information is available here and at the See Co. webpage.
Instrument: Bruker D8 AXS Single-Crystal X-Ray Diffractometer